International Test Conference, the cornerstone of TestWeek(tm) events, is the world"s premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers.

International Test Conference 2008 was held in Santa Clara from October 28-30, 2008.ITC 2009 will be held in Austin, Texas November 3-5. Test Week activities take place November 1-6. The conference will focus on the following: adaptive test, built-in self-test, low-cost ATE, RF test, test data analysis, and many more topics.

“ITC usually sets the tone for test during following year, and this year was no different. Overall, ITC lived up to its high standards and continues be on VLSI"s must attend list. The high degree of technical proceedings coupled with the commercial side at the exhibition floor and the adjacent sites make ITC the perfect combination for advancing test technology while marketing test solutions to address customer problems. With over 1,000 yearly attendees, it is one the few conferences that really make the difference.”
—Risto Puhakka, president, VLSI Research Inc.